题  目：On the Deployment of On-Chip Noise Sensors

时  间：2017年年6月14日 10:30AM

地  点：老生仪楼 五楼会议室

报告人：Yiyu Shi

专家介绍：Dr.Yiyu Shi is currently an associate professor in the Departments of Computer Science and Engineering and Electrical Engineering at the University of Notre Dame.He received his B.S. degree (with honors) in Electronic Engineering from Tsinghua University, Beijing, China in 2005, the M.S and Ph.D. degree in Electrical Engineering from the University of California, Los Angeles in 2007 and 2009 respectively. He is also an associate editor of ACM Journal on Emerging Technologies in Computing Systems, IEEE VLSI Circuits and Systems Newsletter, and ACM SIGDA Newsletter. He is a senior member of IEEE.

报告内容：The relentless technology scaling has led to significantly reduced noise margin and complicated functionalities. Accordingly, with demanding resource constraints, design time techniques per se are less likely to ensure power integrity. Recently several works have shed light on the possibilities of runtime noise management systems, most of which rely on on-chip noise sensors to accurately capture voltage emergencies. However, they all assume, either implicitly or explicitly, that the locations and thresholds of the sensors are given. It remains open problems how to optimally place a given number of noise sensors and how to optimally set their thresholds for best voltage emergency detection. This talk will shed light on both problems from a statistical perspective.